New/prospective users

If you are interested in learning more about the RSoXS capabilities at SST1 and/or becoming a user, start by contacting the beamline scientist.

Schedule a (video) meeting with the beamline scientist to discuss proposed measurements. Be ready to share/discuss the following:

Key research questions

• What is the overall goal of this project?
• What information might RSoXS provide that is not available through other measurement techniques?

Sample chemistry

• What elements are present, and in what concentrations?
• Do these elements have atomic absorption edges that are within the energy range of the beamline?
• Are there two or more elements in the material that might have absorption edges at similar energies?
• What functional groups are present, and how are their dipole moments oriented?

Assembled structure of the material

• What size scales are present in the sample? Will the scattering angles be visible on the available detectors at the desired energies?
• Can the assembled features be oriented as desired? e.g., can lamellae be oriented perpendicular to the substrate?

Sample form/environment (e.g., dry film, solution, thickness, etc.)

• Are the samples compatible with an ultra-high vacuum environment?
• Samples should be thin films below 200 nm thickness. Is this possible? Is it representative of the physics in the intended sample environment (see key research questions)?
• RSoXS and transmission NEXAFS samples often are prepared on silicon nitride membranes (e.g., NX5200C from Norcada) that allow transmission through the substrate.
  • Drop casting is easiest, but thickness/roughness is less controllable.
  • Floating might be compatible for certain sample chemistries.
  • Spin coating might be possible if done very carefully, but the silicon nitride window can break easily.
  • Back etching would require assistance from the NIST Gaithersburg team.
• TEY NEXAFS can be performed on thin film samples on silicon wafers.
• Liquid RSoXS capabilities are in very early stage of development and would require assistance from the NIST Gaithersburg team. It is best to start with solid samples if possible.
  • Is flow required, or can a static sample be measured?
  • What are the viscosities of the samples?

In some cases, it might make sense for prospective users to send a few preliminary samples to the beamline scientist to check feasibility prior to submitting a General User proposal. Below are samples that are often suggested for preliminary measurements:

• Thin films on Si wafers of pure components in a multi-component system. TEY NEXAFS can be performed (at varying angles/polarizations) to extract optical constants and model scattering.
• 1-2 samples of the multi-component system on silicon nitride. Preliminary RSoXS measurements can be performed, and the data can be analyzed to see if there are any promising results.

Note that there is no guarantee these samples can be run. Measurements will be subject to beam availability and other beamline priorities.

In the meantime, feel free to explore the wiki and especially the literature and resources on the main page.